Publications

Johanna Baehr, Alessandro Bernardini, Georg Sigl, Ulf Schlichtmann
Machine learning and structural characteristics for reverse engineering
Integration, the VLSI Journal 72, 1-12
2020

Alessandro Bernardini, Chunfeng Liu, Bing Li, Ulf Schlichtmann
Fault Localization in Programmable Microfluidic Devices
In: Design, Automation and Test in Europe (DATE)
March 2019

Xu Liu, Xing Zhou, Alessandro Bernardini, Ulf Schlichtmann
A Compact Model of Negative Bias Temperature Instability Suitable for Gate-Level Circuit Simulation
In: IEEE International Symposium on Quality Electronic Design (ISQED)
March 2019

Johanna Baehr, Alessandro Bernardini, Georg Sigl, Ulf Schlichtmann
Machine Learning and Structural Characteristics for Reverse Engineering
In: Asia and South Pacific Design Automation Conference
January 2019

Alessandro Bernardini, Chunfeng Liu, Bing Li, Ulf Schlichtmann
Efficient spanning-tree-based test pattern generation for Programmable Microfluidic Devices
Microelectronics Journal
September 2018

Alessandro Bernardini, Wolfgang Ecker, Ulf Schlichtmann
Where Formal Verification Can Help in Functional Safety Analysis
In: IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
November 2016

Alessandro Bernardini, Wolfgang Ecker, Ulf Schlichtmann
Efficient handling of the fault space in functional safety analysis utilizing formal methods
In: 2016 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
September 2016

Alessandro Bernardini, Ulf Schlichtmann
Symbolic Fault Modeling and Model Counting for the Identification of Critical Gates in Digital Circuits
In: ZuE 2015; 8. GMM/ITG/GI-Symposium Reliability by Design; Proceedings of
September 2015