Helmut Graeb (IEEE Fellow since 2014) received the Dipl.-Ing., Dr.-Ing., and Habilitation degrees in electrical engineering from the Technical University of Munich (TUM), Munich, Germany, in 1986, 1993, and 2008, respectively. He was with Siemens Corporation, Munich, from 1986 to 1987, where he was involved in the design of DRAMs. Since 1987, he has been with the Chair of Electronic Design Automation, TUM, where he has been the Head of a research group since 1993. He has published around 200 papers, six of which were nominated for best papers at the Design Automation Conference (DAC), the International Conference on Computer-Aided Design (ICCAD), and the Design, Automation and Test in Europe (DATE) conference. His current research interests include design automation for analog and mixed-signal circuits, with particular emphasis on Pareto optimization of analog circuits considering parameter tolerances, analog design for yield and reliability, hierarchical sizing of analog circuits, analog/mixed-signal test design, discrete sizing of analog circuits, structural analysis of analog and digital circuits, and analog layout. Dr. Graeb was a recipient of the 2008 Prize of the Information Technology Society (ITG), the 2004 Best Teaching Award of the TUM EE Faculty Students Association, and the Third Prize of the 1996 Munich Business Plan Contest. He has served as the Vice-President Publications of the IEEE Council on Electronic Design Automation, as Executive Committee Member of the ICCAD, as member or the Chair of the Analog Program Subcommittees of the ICCAD, DAC, and DATE conferences, as Associate Editor of the IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—PART II: ANALOG AND DIGITAL SIGNAL PROCESSING and the IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, and as member of the Technical Advisory Board of MunEDA GmbH Munich, which he co-founded. He is a member of VDE ITG and VDE/VDI-Society Microelectronics, Microsystems, and Precision Engineering.
A long version of the CV can be found here.