To measure the shape of a surface using Speckle-Interferometry, at least
two interferograms (a) have to be acquired each with another illuminating wavelength.
Applying a phase shifting algorithm on these interferograms will lead to a phase image (b).
A so called unwrapping-algorithm can calculate an image (c)
where the shape of the surface is directly linked to the gray level.
This technology can also be used to acquire other quantities of the object,
e.g. strain, deformation, displacement, …

Current research objectives at the Institute for Measurement Systems and Sensor Technologies are the optimization of Speckle-Interferometry regarding resolution
and robustness as well as data fusion with roughness measurements
using Speckle-Interferometry.